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relevant to the instrumentation control and the radiation measurment
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NEW product! Pileup separator processor November, 1, 2017
 Start of sample program provision August, 1, 2017
Pulse Shape Discrimination July, 3, 2017

NEW product! Pileup separator processor

A processor that executes separate in real time is installed in hardware!
Connecting the boards further improves the output!

1Gsps, 14-bit ADC
100Msps, 16-bit ADC

New technical information

The new product above was presented at the "The 2017 IEEE NSS - MIC" held in Atlanta from 24th to 26th November 2017 as a company presentation.

Please read through.
2.8 MB

Started providing sample programs

Sample programs

For the products below, we have prepared a sample program so that you can use it in the program environment created by the customer.

APN504(X) NIM module type, DSP 4 CH with built-in high voltage preamplifier power supply
APU101(X) Unit type, DSP 1 CH with built-in high voltage preamplifier power supply
APN101(X) NIM module type, DSP 1 CH with built-in high voltage / preamplifier power supply
APG7400A USB-MCA4, list mode compatible USB bus power operation MCA4CH

The operating environment is Microsoft Visual C ++, Visual C #, National Instruments LabVIEW, Linux.

A corresponding model will be added in the future.
We are waiting for requests!
For details, please contact us by email or telephone (+81-29-350-8011).


New option: Pulse Shape Discrimination

Integrate the specified range individually for TOTAL (full range), FALL (falling part), RISE (rising part) for the waveform collected by the DPP board, and transfer it to the PC via Ethernet as list data. The 2D histogram is displayed based on the integration result. Objects on the vertical and horizontal axes of the histogram can be selected arbitrarily, and data in the specified range can be extracted and a one-dimensional histogram can be displayed.

SDD system for vaccum compatible and equipped with focused SDD array

A new product lineup has been added to our SDD (Silicon Drift Detector) system. This system has gained popularity from customers. This new product XSDD 50-04-25, the focal length of the specimen can be made as short as possible by the detector surface at 25 degrees, and the measuring method can be expanded.

In addition to the excellent counting rate and energy resolution originally possessed by SDD, please enjoy the highest level measurement with the data measurement device APU 504 GbE which developed by our development / design specialist at your X-ray beam line.

It can be customized according to your request. Please do not hesitate to contact us for product details.


Started manufacturing and salling SDD system for vaccum compatible

We launched manufacturing and selling SDD (Silicon Drift Detector) system which is corresponding to the vacuum. This new product has high counting rate and high energy resolution, and therefore it used by Photon Factory and Synchrotron Radiation Facility in Japan. This detector system is possible to measure a light element such as a carbon, and it realized a high sensivity using more SDD. We design and manufacture these kind of products by ourselves, so we customize a diameter and type of the flange, the number of elements of SDD and the length of the pipe.


XSDD50-04 Catalog

XSDD50-01 Catalog
4 element SDD, corresponding to the vacuum

1 element SDD, corresponding to the vacuum
SDD 65mm2 collimated 50mm2 Window-less or AP3.3 

All element area
260mm2 (65mm2 x 4 element)

Active area
200mm2 (65mm2 x collimated 50mm2 x 4 element)

65mm2 x collimated 50mm2
Vaccum capable
<10-5 Pa

Flange type
ICF114 (Standard)

ICF70 (Standard)
Option (Use cases)

Transport with bellows
corresponding to the vacuum

Gate valve and Angle valve
Transport with bellows
corresponding to the vacuum

Power Supply
-200V, ±5V, +3.3V

Recommended module
(Power Supply)

APN3900 (NIM module)
APV3900 (VME module)

APN301 (NIM module)
APV301 (VME module)
APU101XSDD (Stand alone) 

Recommended module
(Measurement Board)



Digital Signal Processor APU101
APU101 is all-in-one digital spectrometer which has high-voltage power supply, preamp power, and MCA (Multi Channel Analyzer). Preamp signal of the detector is directly input to the APU101, and the digital signal processing is processed a high-speed ADC (100MHz, 14bit) and high-integrated FPGA. The measurement data will be transferred to the PC via Ethernet.
APU101 (Front) APU101 (Rear) Catalog

・Resolution: 125eV@5.9keV 2us PT (SDD)
         250eV@5.9keV 0.25us PT (multi SSD)
・Throughput: 1Mcps and more
・Trapezoidal filter: 0.1 - 12us
・Functions: ROI-SCA, Bias supply (±4000V), GATE, VETO
Screen of Application  

Multi-element SDD fluorescence X-ray

7 elements SDD and Data acquisition and power module.
XSDD50 Series is all-in-one system which has detector, which is needed X-ray absorption microstructure measurement in the analysis of materials field, data acquisition board, and power supply. It was realized high-sensitivity by multiple SDD detector with high-count rate and energy resolution. Additionally, it is possible to be measured high-count rate by a transistor reset processing and DSP processing.
・All effective area: 350mm2 (65mm2 colimated to 50mm2 x 7 elements)
・Function: Histogram, List, Waveform, ROI-SCA.
・ADC: 8CH, 100MSPS, 14bit
・Energy resolution: 244eV@5.9keV MnKα (PT 0.25us, 1000kOCR)
・Interface: Ethernet (TCP/IP)
(400k ICR 185eV@5.9keV 0.25us Peaking time)

・CH: 4CH
・Static Dead Time: 1.5us
・Mode: Spectrum, List
・Throughput: 50kcps and more
・ADC Gain: 16384, 8192, 4096, 2048, 1024, 512
・Power: USB bus power
・Interface: USB 2.0
APG7400A (Front) Catalog
APG7400A (Rear) General configuration

Positron Lifetime Measurement System

Positron lifetime measurement is used for the measurement of vacancy-type defect of semiconductor in materials field. This is an all-in-one positron lifetime measurement system with measurement device and power supply. In the lifetime measurement, the life time is calculated by using 3GSPS, which is imported by high-speed pulse signal from two BaF2 scintillators. In the Coincidence Doppler broadening (CDB), the 2D histogram is made by wave height value of coincidence from two Ge semiconductor detectors. Additionally, these devices can be combine to be measured by AMOC, which is the correlation of lifetime and momentum.
Positron Lifetime Measurement System
Lifetime Mode CDB Mode AMOC Mode

High Resolution Digital Pulse Processor APV8508-14/12Gb (500MSPS)
・ADC: 500MSPS, Resolution 14/12bit, 8CH
・Timestamp: 64bit (Max 55 month) 7.8ps LSB
・Throughput: 1Mcps and more / CH (Histogram mode)
         150kcps and more / 8CH (List mode)
・Analysis mode: List (TDC+QDC etc.), Wave, Histogram, etc.
・Function: (Digital) CFD, TDC, QDC, PSA, (Option) Coincidence
・Interface: TCP/IP, Gigabit Ethernet
・Data transfer: 20MByte/sec and more
・Use example: gamma/neutron discrimination and β-ray  measurement, high-speed/high-resolution scintillator, such as LaBr3, LYSO, etc.
Energy resolution
Wave Analysis example
Time resolution

Digital Signal Processor APN504X GbE
APN504X is a radiation measurement device with digital signal processing (DSP) for X-ray spectroscopy. APN504X does not use conventional spectroscopy amp. It directly input the preamp signal of the detector, such as SDD, Si(Li), SSD, SiPin, etc. And then, it does digital signal processing by high-speed ADC (100MHz, 14bit) and highly-integrated FPGA. The measurements data are Hito, List, and Quick scan. These data transferred to the PC via network. The application is attached without cost.

Quick scan mode is a time resolution measurement. In this mode, it send histogram data to the PC by every outside trigger timing (Min. 10ms), and PC saves data to an HDD consecutively. This mode is most suitable for the QXAFS measurement.
(L: Front, R: Rear)
・CH: 4CH simultaneous sampling
・Resolution (@5.9keV):
 [In the case of 19 elements SSD]
 139eV 6us Peaking Time
 250eV 0.5us Peaking Time, *Comparable Analog 0.25us
 [In the case of SDD (high-resolution type)]
 125eV 2us Peaking Time
 145eV 0.5us Peaking Time, *Comparable Analog 0.25us
・Throughput: 1Mcps and more
・Interface: TCP/IP, Gigabit Ethernet
Emitted light exposure examination  

Technical information

This is a presentation file in "2014 IEEE-NPSS Real Time Conference (RT)".

Not only the summary of the product but also you will find the description, etc. and measurement data and user case studies of basic performance. Please read by all means.

PDF 15.7MB

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Last Update: April 6, 2018
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