Announcement

NEWS!

16CH simultaneous sampling & waveform discrimination digitizer

High-counting, high-resolution CdTe detector system

Signal processing module for 10Gbps communication

High-Speed Amplifier Discriminator

Gain-switchable high-speed amplifier

Charge-sensitive preamplifier For semiconductor detectors

Up to 8-channel output Board for MPPC voltage application

Digital Signal Processor with Max. 32 channel input

Hybrid Digital Spectrum Analyzer

Random Pulse Generator

MCA with up to 16 input channels

MCA with spectroscopic amplifier

MCA with up to 16 input channels

・High-speed ADC installed for each channel ・Up to 16 channels ・Conversion time 100ns or less ・Throughput 200kcps/channel or more ・List data transfer up to 1 Mcps/board or more Product catalog APV8216

MCA with Spectroscopic amplifier

This is a multi-channel analyzer with up to 16-channel input that realizes the semi-Gaussian waveform shaping of a spectroscopic amplifier by digital signal processing. Parameter settings such as shaping time, gain, and pole zero can be changed programmably from the PC while maintaining the ease of use of the analog amplifier. ・Up to 16 channels ・Energy resolution 1.70keV@1.33MeV ・Throughput 50kcps/channel or more Product catalog APV8816AMP

5Gsps, 32ch input, switched capacitor ADC board

Up to 32 channels of analog pulse can be converted at high speed using a switched capacitor ADC. We will help you build an advanced measurement system by applying it to various needs. Product catalog APV81G32 Main customers in Japan Nuclear Science Institute, Institute for Fusion Science National Institute for Quantum Science and Technology Naka Fusion Research Institute

Digital Positron Annihilation Lifetime Measurement System

CATALOGUE

BROCHURE

ALL-in-ONE	Positron lifetime measurement is used for the measurement of vacancy-type defect of semiconductor in materials field. This is an all-in-one positron lifetime measurement system with measurement device and power supply. In the lifetime measurement, the life time is calculated by using 3 Gsps, which is imported by high-speed pulse signal from two BaF2 scintillators. In the Coincidence Doppler broadening (CDB), the 2D histogram is made by wave height value of coincidence from two Ge semiconductor detectors. Additionally, these devices can be combine to be measured by AMOC, which is the correlation of lifetime and momentum.
Lifetime	Coincidence Doppler Broadening	AMOC

Compact MCA APG7305A USB-MCA-amp with built-in spectroscopic amplifier function

Image of APG7305A	Configuration example
It is a lightweight, compact MCA that works with USB bus power from PC, which realized semi-Gaussian waveform shaping function of spectroscopic amplifier by digital signal processing. Parameter settings such as shaping time and gain can be changed to programmable by computer.  It has low noise, wide gain, programmable shaping time, and it is compatible with a wide range of detectors such as semiconductor detectors, proportional counters and scintillation detectors. Moreover, it is possible to obtain very stable high resolution with automatic gated BLR.
CATALOGUE
Channel	1 channel
Shaping time	0.25 μs or more. 0.625 and 0.125 us are not supported.
Functions	Spectrum mode and WAVE mode
Throughput	50 kcps or more
ADC gain	16384, 8192, 4096, 2048, 1024, 512
Powersupply	USB bus power
Communication I / F	USB 2.0
Dimentions	70 mm (W) x 160 mm (D) x 20 mm (H)
Weight	Approximately 230g

Pileup separator processor

 A processor that executes separate in real time is installed in hardware!
Connecting the boards further improves the output!

1Gsps, 14-bit ADC APV8101S	100Msps, 16-bit ADC APV8011S

New technical information The new product above was presented at the "The 2017 IEEE NSS - MIC" held in Atlanta from 24th to 26th November 2017 as a company presentation. Please read through.

2.8 MB

Sample programs

Option: Pulse Shape Discrimination

SDD system for vaccum compatible and equipped with focused SDD array

Silicon Drift Detector (SDD) system for vaccum compatible

We launched manufacturing and selling Silicon Drift Detector (SDD) system which is corresponding to the vacuum. This product has high counting rate and high energy resolution, and therefore it used by Synchrotorn radiation facilities and Photon factory in Japan. This system is possible to measure a light element such as a carbon, and it realize a high sensivity using more element of SDD. We desing and manufacture these kind of product by ourselves, so we customize a diameter and type of flange, the number of element, and the length of cylinder.

Model	XSDD50-04 CATALOGUE	XSDD50-01  CATALOGUE
Appearance
Detector	4 element SDD, corresponding to the vacuum	1 element SDD, corresponding to the vacuum
Element	SDD 65mm2 collimated 50mm2 Window-less or AP3.3
All element area	260mm2 (65mm2 x 4 element)	65mm2
Active area	200mm2 (65mm2 x collimated 50mm2 x 4 element)	65mm2 x collimated 50mm2
Vaccum capable	<10-5 Pa
Flange type	ICF 114 (Standard)	ICF 70 (Standard)
Option	Transport with bellows corresponding to vaccum	Gate valve and angle valve Transport with bellows corresponding to vaccum
Power Supply	minus 200 V, plus or minus 5 V, plus 3.3 V
Recommende Power Supply	APN3900 (NIM) APV3900 (VME)	APN301 (NIM) APV301 (VME) APU101XSDD (UNIT)
Recommende Measurement board	APN504XGbE	APU101XSDD

Digital Signal Processor APU101

CATALOGUE

Front	APU101 is ALL-in-ONE digital spectrometer which has high-voltage power supply, preamp power, and MCA (Multi Channel Analyzer). Preamp signal of the detector is directly input to the APU101, and the digital signal processing is processed a high-speed ADC (100MHz, 14bit) and high-integrated FPGA. The measurement data will be transferred to the PC via Ethernet.
Rear
Screen of application	Resolution: 125 keV @ 5.9 keV, Peaking time: 2 us (SDD)   250 eV @ 5.9 keV @ Peaking time: 0.25 us (multi-SSD)  Throughput: 1 Mcps and more  Trapezoidal filter: 0.1 to 12 us  Functions: ROI-SCA, GATE, VETO, Bias supply (plus or minus 4000 V)

Multi-element SDD fluorescence X-ray

Detector of XSDD50-07

XSDD Series is ALL-in-ONE system which has detector, which is needed X-ray absorption microstructure measurement in the analysis of materials field, data acquisition board, and power supply. It was realized high-sensitivity by multiple SDD detector with high-count rate and energy resolution. Additionally, it is possible to be measured high-count rate by a transistor reset processing and DSP processing.

Screen of application ICR: 400 k 185 eV @ 5.9 keV Peaking time: 0.25 us

・All effective area: 350 mm2 (65 mm2 colimated to 50 mm2 x 7 elements)  ・Function: Histogram, List, Waveform, ROI-SCA.  ・ADC: 8 channel, 100 Msps, 14-bit  ・Energy resolution: 244 eV @ 5.9 keV MnKα (Peaking time: 0.25 us, OCR: 1000 k)  ・Interface: Ethernet (TCP / IP)

APG7400A USB-MCA4

CATALOGUE

Front	Device connection example
Rear
Number of channles	4 channels
Dead-time	1.5 us
Measurement Mode	Spectrum and List
Throughput	50 kcps and more
ADC Gain	16384, 8192, 4096, 2048, 1024, 512
Power supply	USB bus power
Communication I / F	USB 2.0

Digital Pulse Processor APV8508-14/12Gb (500 Msps)

CATALOGUE

APV8508-14    APV8508-12	・Timestamp: 64-bit (Max. 55 month) LSB: 7.8 ps ・Throughput: 1 Mcps and more / channel (Histogram mode) 150 kcps and more / channel (List mode) ・Analysis mode: List (TDC + QDC etc.), Wave, Histogram, etc. ・Function: (Digital) CFD, TDC, QDC, PSA, (Option) Coincidence ・Communication I / F: TCP / IP, Gigabit Ethernet ・Data transfer: 20 MByte / sec. and more ・Use example: Gamma and Neutron discrimination and beta-ray measurement, high-speed / high-resolution scintillator, such as LaBr3, LYSO, etc.
Analysis example	Wave mode	Histogram mode

Digital Signal Processor APN504X GbE

CATALOGUE

Front / Rear

APN504X is a radiation measurement device with digital signal processing (DSP) for X-ray spectroscopy. APN504X does not use conventional spectroscopyamp. It directly input the preamp signal of the detector, such as SDD, Si(Li), SSD, SiPin, etc. And then, it does digital signal processing by high-speed ADC (100 MHz, 14-bit) and highly-integrated FPGA. The measurements data are Histogrum, List, and Quick scan. These data transferred to the PC via network. The application is attached without cost. Quick scan mode is a time resolution measurement. In this mode, it send histogram data to the PC by every outside trigger timing (Min. 10 ms), and PC saves data to an HDD consecutively. This mode is most suitable for the QXAFS measurement.

Emitted light exposure examination

・Number of channels: 4 channels, simultaneous sampling ・Resolution (@5.9 keV): [In the case of 19 elements SSD] 　139 eV Peaking Time: 6 us 　250 eV Peaking Time: 0.5 us, *Comparable Analog 0.25 us [In the case of SDD (high-resolution type)] 　125 eV Peaking Time: 2 us 　145 eV Peaking Time: 0.5 us, *Comparable Analog 0.25 us ・Throughput: 1 Mcps and more ・Communication I / F: TCP / IP, Gigabit Ethernet

PDF 15.7 MB

This is a presentation file in "2014 IEEE-NPSS Real Time Conference (RT)".Not only the summary of the product but also you will find the description, etc. and measurement data and user case studies of basic performance. Please read by all means.