|Design and manufacture of electronic circuits
relevant to the instrumentation control and the radiation measurment
Contact us: email@example.com
AnnouncementNotice of Specification Change
Target product: 4-channel multi-channel analyzer
Product model number: APG7400A
Description of change: ADC conversion gain was changed from 16k to 4k.
Reason for the change: Due to a replacement product that was changed due to a shortage of semiconductors.
We apologize for the inconvenience and ask for your understanding.
We will strive to develop better products, and we appreciate your continued support and guidance.
8th January 2024
|512CH readout system can be built (when 32-board synchronization is used)
ADC: 250Msps 16 channels, 14-bit resolution
Time resolution: Coarse 4 nanoseconds, Fine 15.6 picoseconds, LSB
Throughput: 1 Mcps or more per channel
*in hist mode measurement
Communication I/F: Gigabit Ethernet TCP/IP
Data transfer: 30 MByte (Gigabit)/second or more
|High-count processing with special CdTe sensor and our proprietary DSP
|High counting time resolution
Resolution at high resolution setting
CdTe size: 5 x 5mm
Window thickness: 1mm
Kyoto University, RISING3
Ultra-fast online processing of quick scan measurements in less than 1
|Input: 8 channels
ADC: 100 MHz, 16-bit
DSP: Baseline restore, pile-up rejector, CFD, etc.
Conversion gain: Up to 4k channels
Measurement mode: Histogram, List
Communication: TCP/IP 10GBASE-SR
|Both positive and negative pulses are supported.
Discriminates signals from detectors such as PMTs at set voltage levels and
TTL pulses are output.
|High-speed amplifier with switchable gain x10/x100.
Ideal for applications where mV output from the detector requires picosecond timing.
applications that require picosecond timing.
|750 eV or less
|Suitable for Schottky type CdTe detector, CdZnTe detector, etc.
Input withstand voltage: 1000 V (BNC connector) or 2000 V (SHV connector)
Ultra-low noise characteristics achieved by our unique circuit configuration.
OEM supply and custom-made production are available.
|The surface panel has 8 channels of HV outputs, and the HV voltage can be set. After setting the HV voltage, the HV ON/OFF switch After setting the HV voltage, the HV voltage with temperature compensation is applied to each channel by the HV ON/OFF switch.
|・ Equipped with DSP for gamma ray spectroscopy
・ Simultaneous sampling of 32 input channels
・ Throughput of 100kcps or more
・ Built-in Base Line Restorer
・ Built-in Trapezoidal Shaper (trapezoidal waveform shaping circuit)
・ With CFD (Constant Fraction Discriminator) function
・ Supports Pile up reject function
|Digital signal processing of both the anode signal from the scintillation detector and the preamplifier signal from the semiconductor detector on one board!
2 type inputs, 8 channels in total for one board
Maximum 4 channels (CH1 to CH4) for scintillation detector
ADC: 500MHz 14-bit
DSP: CFD, TDC, QDC, etc.
Maximum 4 channels (CH5 to CH8) for semiconductor detectors
ADC: 62.5MHz 16-bit
DSP: Baseline Restorer, Pileup Reject
2-channel random pulse generator with excellent cost performance
Reproduce the stochastic event of Poisson distribution by the exponential random number generation algorithm by the digital method.
Digital white noise generation algorithm.
Digital Positron Annihilation Lifetime Measurement SystemCATALOGUE
Compact MCA APG7305A USB-MCA-amp with built-in spectroscopic amplifier function
Pileup separator processor
A processor that executes separate in real time is installed in hardware!
Sample programsSample programs
For the products below, we have prepared a sample program so that you can use it in the program environment created by the customer.
Option: Pulse Shape DiscriminationIntegrate the specified range individually for TOTAL (full range), FALL (falling part), RISE (rising part) for the waveform collected by the DPP board, and transfer it to the PC via Ethernet as list data. The 2D histogram is displayed based on the integration result. Objects on the vertical and horizontal axes of the histogram can be selected arbitrarily, and data in the specified range can be extracted and a one-dimensional histogram can be displayed
SDD system for vaccum compatible and equipped with focused SDD arrayOur Silicon Drift Detector (SDD) system has gained popularity from customers. This product XSDD50-04-25, the focal length of the specimen can be made as short as possible by the detector surface at 25 degrees, and the measuring method can be expanded.
In addition to the excellent counting rate and energy resolution originally possessed by SDD, please enjoy the highest level measurement with the data measurement device APU504XGbE which developed by our development / design specialist at your X-ray beam line.
It can be customized according to your request. Please do not hesitate to contact us for product details.
Silicon Drift Detector (SDD) system for vaccum compatible
We launched manufacturing and selling Silicon Drift Detector (SDD)
system which is corresponding to the vacuum. This product has high counting
rate and high energy resolution, and therefore it used by Synchrotorn radiation
facilities and Photon factory in Japan. This system is possible to measure
a light element such as a carbon, and it realize a high sensivity using
more element of SDD. We desing and manufacture these kind of product by
ourselves, so we customize a diameter and type of flange, the number of
element, and the length of cylinder.
Digital Signal Processor APU101CATALOGUE
Multi-element SDD fluorescence X-rayCATALOGUE
Seven element SDD and Data acquisition and power supply module
Digital Pulse Processor APV8508-14/12Gb (500 Msps)CATALOGUE
Digital Signal Processor APN504X GbECATALOGUE